Examining the Adversarial Test Accuracy of Later Exits in NEO-KD Networks
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Authors:
(1) Seokil Ham, KAIST;
(2) Jungwuk Park, KAIST;
(3) Dong-Jun Han, Purdue University;
(4) Jaekyun Moon, KAIST.
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Table of Links
Abstract and 1. Introduction
2. Related Works
3. Prop...